%0 Journal Article %1 journals/mr/YangLZKM17 %A Yang, Kexin %A Liu, Taizhi %A Zhang, Rui %A Kim, Dae Hyun %A Milor, Linda %D 2017 %J Microelectron. Reliab. %K dblp %P 81-86 %T Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#YangLZKM17 %V 76-77

@article{journals/mr/YangLZKM17, added-at = {2022-01-06T00:00:00.000+0100}, author = {Yang, Kexin and Liu, Taizhi and Zhang, Rui and Kim, Dae Hyun and Milor, Linda}, biburl = {https://www.bibsonomy.org/bibtex/27b28ec84a97bdba1202e5eed5a5757ed/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.06.038}, interhash = {aa54cb3972320f035cab4e4c86e98e11}, intrahash = {7b28ec84a97bdba1202e5eed5a5757ed}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {81-86}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#YangLZKM17}, volume = {76-77}, year = 2017 }