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%0 Conference Paper
%1 conf/date/BrakelGKV95
%A Brakel, G. Van
%A Gläser, Uwe
%A Kerkhoff, Hans G.
%A Vierhaus, Heinrich Theodor
%B ED&TC
%D 1995
%I IEEE Computer Society
%K dblp
%P 308-313
%T Gate delay fault test generation for non-scan circuits.
%U http://dblp.uni-trier.de/db/conf/date/edtc1995.html#BrakelGKV95
%@ 0-8186-7039-8
@inproceedings{conf/date/BrakelGKV95,
added-at = {2022-05-20T00:00:00.000+0200},
author = {Brakel, G. Van and Gläser, Uwe and Kerkhoff, Hans G. and Vierhaus, Heinrich Theodor},
biburl = {https://www.bibsonomy.org/bibtex/26bf9aefa7e333c73d72c246eb10240b5/dblp},
booktitle = {ED&TC},
crossref = {conf/date/1995},
ee = {https://dl.acm.org/doi/10.5555/787258.787453},
interhash = {adeb2c616f73c76118eac9079ff4bf10},
intrahash = {6bf9aefa7e333c73d72c246eb10240b5},
isbn = {0-8186-7039-8},
keywords = {dblp},
pages = {308-313},
publisher = {IEEE Computer Society},
timestamp = {2024-04-09T12:36:04.000+0200},
title = {Gate delay fault test generation for non-scan circuits.},
url = {http://dblp.uni-trier.de/db/conf/date/edtc1995.html#BrakelGKV95},
year = 1995
}