%0 Conference Paper %1 conf/date/BrakelGKV95 %A Brakel, G. Van %A Gläser, Uwe %A Kerkhoff, Hans G. %A Vierhaus, Heinrich Theodor %B ED&TC %D 1995 %I IEEE Computer Society %K dblp %P 308-313 %T Gate delay fault test generation for non-scan circuits. %U http://dblp.uni-trier.de/db/conf/date/edtc1995.html#BrakelGKV95 %@ 0-8186-7039-8

@inproceedings{conf/date/BrakelGKV95, added-at = {2022-05-20T00:00:00.000+0200}, author = {Brakel, G. Van and Gläser, Uwe and Kerkhoff, Hans G. and Vierhaus, Heinrich Theodor}, biburl = {https://www.bibsonomy.org/bibtex/26bf9aefa7e333c73d72c246eb10240b5/dblp}, booktitle = {ED&TC}, crossref = {conf/date/1995}, ee = {https://dl.acm.org/doi/10.5555/787258.787453}, interhash = {adeb2c616f73c76118eac9079ff4bf10}, intrahash = {6bf9aefa7e333c73d72c246eb10240b5}, isbn = {0-8186-7039-8}, keywords = {dblp}, pages = {308-313}, publisher = {IEEE Computer Society}, timestamp = {2024-04-09T12:36:04.000+0200}, title = {Gate delay fault test generation for non-scan circuits.}, url = {http://dblp.uni-trier.de/db/conf/date/edtc1995.html#BrakelGKV95}, year = 1995 }