%0 Conference Paper %1 conf/itc/ChakrabartyLZM97 %A Chakrabarty, Krishnendu %A Liu, Jian %A Zhu, Minyao %A Murray, Brian T. %B ITC %D 1997 %I IEEE Computer Society %K dblp %P 328-337 %T Test Width Compression for Built-In Self Testing. %U http://dblp.uni-trier.de/db/conf/itc/itc1997.html#ChakrabartyLZM97 %@ 0-7803-4209-7

@inproceedings{conf/itc/ChakrabartyLZM97, added-at = {2023-03-23T00:00:00.000+0100}, author = {Chakrabarty, Krishnendu and Liu, Jian and Zhu, Minyao and Murray, Brian T.}, biburl = {https://www.bibsonomy.org/bibtex/26e5cb43ed6c5579e199b624ba2f088e3/dblp}, booktitle = {ITC}, crossref = {conf/itc/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639634}, interhash = {ae15b0abb5cc620b89d6486208b7dbbc}, intrahash = {6e5cb43ed6c5579e199b624ba2f088e3}, isbn = {0-7803-4209-7}, keywords = {dblp}, pages = {328-337}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:11.000+0200}, title = {Test Width Compression for Built-In Self Testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1997.html#ChakrabartyLZM97}, year = 1997 }