%0 Conference Paper %1 conf/ets/MaurouxVBDGPGFV10 %A Mauroux, Pierre-Didier %A Virazel, Arnaud %A Bosio, Alberto %A Dilillo, Luigi %A Girard, Patrick %A Pravossoudovitch, Serge %A Godard, Benoît %A Festes, Gilles %A Vachez, Laurent %B European Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 81-86 %T A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction. %U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#MaurouxVBDGPGFV10 %@ 978-1-4244-5833-2

@inproceedings{conf/ets/MaurouxVBDGPGFV10, added-at = {2017-05-22T00:00:00.000+0200}, author = {Mauroux, Pierre-Didier and Virazel, Arnaud and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Pravossoudovitch, Serge and Godard, Benoît and Festes, Gilles and Vachez, Laurent}, biburl = {https://www.bibsonomy.org/bibtex/2611552c4273929653367f6b2a13fb35e/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2010}, ee = {https://doi.org/10.1109/ETSYM.2010.5512776}, interhash = {1ae6375a9039bf3e8398248c64303fe3}, intrahash = {611552c4273929653367f6b2a13fb35e}, isbn = {978-1-4244-5833-2}, keywords = {dblp}, pages = {81-86}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#MaurouxVBDGPGFV10}, year = 2010 }