%0 Conference Paper %1 conf/itc/KawaiSFKKOS83 %A Kawai, Masato %A Shibano, Hideo %A Funatsu, Shigehiro %A Kato, Shunichi %A Kurobe, T. %A Ookawa, K. %A Sasaki, Tohru %B ITC %D 1983 %I IEEE Computer Society %K dblp %P 346-353 %T A High Level Test Pattern Generation Algorithm. %U http://dblp.uni-trier.de/db/conf/itc/itc1983.html#KawaiSFKKOS83

@inproceedings{conf/itc/KawaiSFKKOS83, added-at = {2012-02-28T00:00:00.000+0100}, author = {Kawai, Masato and Shibano, Hideo and Funatsu, Shigehiro and Kato, Shunichi and Kurobe, T. and Ookawa, K. and Sasaki, Tohru}, biburl = {https://www.bibsonomy.org/bibtex/2a67fa1baa98e547df1c7f453a49bbbb4/dblp}, booktitle = {ITC}, crossref = {conf/itc/1983}, interhash = {aed3ec3644ce16b55f3ddeaffd746e1c}, intrahash = {a67fa1baa98e547df1c7f453a49bbbb4}, keywords = {dblp}, pages = {346-353}, publisher = {IEEE Computer Society}, timestamp = {2012-02-29T11:35:05.000+0100}, title = {A High Level Test Pattern Generation Algorithm.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1983.html#KawaiSFKKOS83}, year = 1983 }