%0 Conference Paper %1 conf/itc/MaurouxVBDGPG09 %A Mauroux, Pierre-Didier %A Virazel, Arnaud %A Bosio, Alberto %A Dilillo, Luigi %A Girard, Patrick %A Pravossoudovitch, Serge %A Godard, Benoît %B ITC %D 2009 %E Roberts, Gordon W. %E Eklow, Bill %I IEEE Computer Society %K dblp %P 1 %T NAND flash testing: A preliminary study on actual defects. %U http://dblp.uni-trier.de/db/conf/itc/itc2009.html#MaurouxVBDGPG09 %@ 978-1-4244-4868-5

@inproceedings{conf/itc/MaurouxVBDGPG09, added-at = {2023-03-23T00:00:00.000+0100}, author = {Mauroux, Pierre-Didier and Virazel, Arnaud and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Pravossoudovitch, Serge and Godard, Benoît}, biburl = {https://www.bibsonomy.org/bibtex/2917c0b46f8795f30b4e83609bdc4bbea/dblp}, booktitle = {ITC}, crossref = {conf/itc/2009}, editor = {Roberts, Gordon W. and Eklow, Bill}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2009.5355898}, interhash = {aeeb0f9a6da5b27a1e9d9a7b1964cd55}, intrahash = {917c0b46f8795f30b4e83609bdc4bbea}, isbn = {978-1-4244-4868-5}, keywords = {dblp}, pages = 1, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:19.000+0200}, title = {NAND flash testing: A preliminary study on actual defects.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2009.html#MaurouxVBDGPG09}, year = 2009 }