%0 Conference Paper %1 conf/itc/XiangXF00 %A Xiang, Dong %A Xu, Yi %A Fujiwara, Hideo %B ITC %D 2000 %I IEEE Computer Society %K %P 520-529 %T Non-scan design for testability for synchronous sequential circuits based on conflict analysis. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#XiangXF00 %@ 0-7803-6546-1

@inproceedings{conf/itc/XiangXF00, added-at = {2023-12-13T06:37:33.000+0100}, author = {Xiang, Dong and Xu, Yi and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/248901c7f49bb818101428a9e7e1ed453/admin}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894245}, interhash = {afb82f33139aad2dac26138d85632b9d}, intrahash = {48901c7f49bb818101428a9e7e1ed453}, isbn = {0-7803-6546-1}, keywords = {}, pages = {520-529}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T06:37:33.000+0100}, title = {Non-scan design for testability for synchronous sequential circuits based on conflict analysis.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#XiangXF00}, year = 2000 }