%0 Journal Article %1 journals/et/MarinissenZ12 %A Marinissen, Erik Jan %A Zorian, Yervant %D 2012 %J J. Electron. Test. %K dblp %N 1 %P 13-14 %T Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits. %U http://dblp.uni-trier.de/db/journals/et/et28.html#MarinissenZ12 %V 28

@article{journals/et/MarinissenZ12, added-at = {2024-02-05T00:00:00.000+0100}, author = {Marinissen, Erik Jan and Zorian, Yervant}, biburl = {https://www.bibsonomy.org/bibtex/2b8f6c882d89d241220ecdacc533a07d7/dblp}, ee = {https://doi.org/10.1007/s10836-012-5279-2}, interhash = {b014583063b5dcc349c76a9dc7b5ba08}, intrahash = {b8f6c882d89d241220ecdacc533a07d7}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 1, pages = {13-14}, timestamp = {2024-04-08T20:52:19.000+0200}, title = {Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#MarinissenZ12}, volume = 28, year = 2012 }