%0 Journal Article %1 journals/mr/KhatirL04 %A Khatir, Zoubir %A Lefebvre, Stéphane %D 2004 %J Microelectron. Reliab. %K dblp %N 6 %P 929-938 %T Boundary element analysis of thermal fatigue effects on high power IGBT modules. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#KhatirL04 %V 44

@article{journals/mr/KhatirL04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Khatir, Zoubir and Lefebvre, Stéphane}, biburl = {https://www.bibsonomy.org/bibtex/218144acbaa32d66ede22c233eb61d561/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.02.007}, interhash = {b1270cd4f134d93a88364fa02f5e8832}, intrahash = {18144acbaa32d66ede22c233eb61d561}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {929-938}, timestamp = {2020-02-25T13:24:09.000+0100}, title = {Boundary element analysis of thermal fatigue effects on high power IGBT modules.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#KhatirL04}, volume = 44, year = 2004 }