%0 Journal Article %1 journals/mr/BenbakhtiAKLHBMTA10 %A Benbakhti, Brahim %A Ayubi-Moak, J. S. %A Kalna, Karol %A Lin, D. %A Hellings, Geert %A Brammertz, Guy %A Meyer, Kristin De %A Thayne, Iain %A Asenov, Asen %D 2010 %J Microelectron. Reliab. %K dblp %N 3 %P 360-364 %T Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#BenbakhtiAKLHBMTA10 %V 50

@article{journals/mr/BenbakhtiAKLHBMTA10, added-at = {2020-11-06T00:00:00.000+0100}, author = {Benbakhti, Brahim and Ayubi-Moak, J. S. and Kalna, Karol and Lin, D. and Hellings, Geert and Brammertz, Guy and Meyer, Kristin De and Thayne, Iain and Asenov, Asen}, biburl = {https://www.bibsonomy.org/bibtex/2fee4189627db60a8f9705a20581d2eba/dblp}, ee = {https://doi.org/10.1016/j.microrel.2009.11.017}, interhash = {b1d27a5124b66f4c7c37c40b1a218649}, intrahash = {fee4189627db60a8f9705a20581d2eba}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 3, pages = {360-364}, timestamp = {2020-11-07T11:36:50.000+0100}, title = {Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#BenbakhtiAKLHBMTA10}, volume = 50, year = 2010 }