%0 Conference Paper %1 conf/ets/KatohI06 %A Katoh, Kentaroh %A Ito, Hideo %B ETS %D 2006 %I IEEE Computer Society %K dblp %P 69-74 %T Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices. %U http://dblp.uni-trier.de/db/conf/ets/ets2006.html#KatohI06 %@ 0-7695-2566-0

@inproceedings{conf/ets/KatohI06, added-at = {2023-03-23T00:00:00.000+0100}, author = {Katoh, Kentaroh and Ito, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/22df0b2d399817218e51baddf031aa35c/dblp}, booktitle = {ETS}, crossref = {conf/ets/2006}, ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2006.10}, interhash = {b2e642701f3dac62e9622b62e2ed587f}, intrahash = {2df0b2d399817218e51baddf031aa35c}, isbn = {0-7695-2566-0}, keywords = {dblp}, pages = {69-74}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:47:35.000+0200}, title = {Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2006.html#KatohI06}, year = 2006 }