%0 Journal Article %1 journals/mr/GhidiniCGSSV05 %A Ghidini, G. %A Capolupo, C. %A Giusto, G. %A Sebastiani, A. %A Stragliati, B. %A Vitali, Maria Elena %D 2005 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1337-1342 %T Tunnel oxide degradation under pulsed stress. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#GhidiniCGSSV05 %V 45

@article{journals/mr/GhidiniCGSSV05, added-at = {2024-01-16T00:00:00.000+0100}, author = {Ghidini, G. and Capolupo, C. and Giusto, G. and Sebastiani, A. and Stragliati, B. and Vitali, Maria Elena}, biburl = {https://www.bibsonomy.org/bibtex/2daf741579e5def56e5dbeec141e8dcbc/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.07.017}, interhash = {b46637de545e368694dfdcef27eda47f}, intrahash = {daf741579e5def56e5dbeec141e8dcbc}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1337-1342}, timestamp = {2024-04-09T02:50:29.000+0200}, title = {Tunnel oxide degradation under pulsed stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#GhidiniCGSSV05}, volume = 45, year = 2005 }