%0 Journal Article %1 journals/access/HerzogBZBDMK23 %A Herzog, Alexander %A Benkner, Simon %A Zandi, Babak %A Buffolo, Matteo %A van Driel, Willem D. %A Meneghini, Matteo %A Khanh, Tran Quoc %D 2023 %J IEEE Access %K dblp %P 19928-19940 %T Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes. %U http://dblp.uni-trier.de/db/journals/access/access11.html#HerzogBZBDMK23 %V 11

@article{journals/access/HerzogBZBDMK23, added-at = {2023-03-11T00:00:00.000+0100}, author = {Herzog, Alexander and Benkner, Simon and Zandi, Babak and Buffolo, Matteo and van Driel, Willem D. and Meneghini, Matteo and Khanh, Tran Quoc}, biburl = {https://www.bibsonomy.org/bibtex/212af4250c2c348f084db3b599481f435/dblp}, ee = {https://doi.org/10.1109/ACCESS.2023.3249478}, interhash = {b4a5889b0060de21446286e28626d302}, intrahash = {12af4250c2c348f084db3b599481f435}, journal = {IEEE Access}, keywords = {dblp}, pages = {19928-19940}, timestamp = {2024-04-08T14:06:49.000+0200}, title = {Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes.}, url = {http://dblp.uni-trier.de/db/journals/access/access11.html#HerzogBZBDMK23}, volume = 11, year = 2023 }