%0 Conference Paper %1 conf/iccad/SunDSKHT16 %A Sun, Zeyu %A Demircan, Ertugrul %A Shroff, Mehul D. %A Kim, Taeyoung %A Huang, Xin %A Tan, Sheldon X.-D. %B ICCAD %D 2016 %E Liu, Frank %I ACM %K dblp %P 113 %T Voltage-based electromigration immortality check for general multi-branch interconnects. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2016.html#SunDSKHT16 %@ 978-1-4503-4466-1

@inproceedings{conf/iccad/SunDSKHT16, added-at = {2021-02-19T00:00:00.000+0100}, author = {Sun, Zeyu and Demircan, Ertugrul and Shroff, Mehul D. and Kim, Taeyoung and Huang, Xin and Tan, Sheldon X.-D.}, biburl = {https://www.bibsonomy.org/bibtex/29043a396e9ec2bb9d777befd6effe518/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2016}, editor = {Liu, Frank}, ee = {https://doi.org/10.1145/2966986.2967083}, interhash = {b4cddde56e1ede6ee4fb8b225fa2a9c8}, intrahash = {9043a396e9ec2bb9d777befd6effe518}, isbn = {978-1-4503-4466-1}, keywords = {dblp}, pages = 113, publisher = {ACM}, timestamp = {2024-04-09T19:27:49.000+0200}, title = {Voltage-based electromigration immortality check for general multi-branch interconnects.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2016.html#SunDSKHT16}, year = 2016 }