%0 Journal Article %1 journals/ieicet/WuHCTHC05 %A Wu, Shih-Dao %A Huang, Guo-Wei %A Chen, Kun-Ming %A Tseng, Hua-Chou %A Hsu, Tsun-Lai %A Chang, Chun-Yen %D 2005 %J IEICE Trans. Electron. %K dblp %N 5 %P 851-856 %T RF MOSFET Characterization by Four-Port Measurement. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet88c.html#WuHCTHC05 %V 88-C

@article{journals/ieicet/WuHCTHC05, added-at = {2020-04-11T00:00:00.000+0200}, author = {Wu, Shih-Dao and Huang, Guo-Wei and Chen, Kun-Ming and Tseng, Hua-Chou and Hsu, Tsun-Lai and Chang, Chun-Yen}, biburl = {https://www.bibsonomy.org/bibtex/285f1d5ad30d6d616f2376c9bd1477987/dblp}, ee = {https://doi.org/10.1093/ietele/e88-c.5.851}, interhash = {b6ae725899f85ee287ff86fa26da9f8e}, intrahash = {85f1d5ad30d6d616f2376c9bd1477987}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 5, pages = {851-856}, timestamp = {2020-04-14T11:48:52.000+0200}, title = {RF MOSFET Characterization by Four-Port Measurement.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet88c.html#WuHCTHC05}, volume = {88-C}, year = 2005 }