%0 Journal Article %1 journals/mam/Niven92 %A Niven, John %D 1992 %J Microprocess. Microsystems %K dblp %N 7 %P 388-389 %T Testing semiconductor memories, theory and practice: van de Goor, A J John Wiley, Chichester, UK (1991) £34.99 pp 536 ISBN 0 471 92586 1, 0 471 92587 X (disc). %U http://dblp.uni-trier.de/db/journals/mam/mam16.html#Niven92 %V 16

@article{journals/mam/Niven92, added-at = {2020-02-22T00:00:00.000+0100}, author = {Niven, John}, biburl = {https://www.bibsonomy.org/bibtex/23852fd3a356bf37767422353b281b044/dblp}, ee = {https://doi.org/10.1016/0141-9331(92)90016-M}, interhash = {1b730dc8b73f8e8c4a8b88f10394d979}, intrahash = {3852fd3a356bf37767422353b281b044}, journal = {Microprocess. Microsystems}, keywords = {dblp}, number = 7, pages = {388-389}, timestamp = {2020-02-25T12:52:45.000+0100}, title = {Testing semiconductor memories, theory and practice: van de Goor, A J John Wiley, Chichester, UK (1991) £34.99 pp 536 ISBN 0 471 92586 1, 0 471 92587 X (disc).}, url = {http://dblp.uni-trier.de/db/journals/mam/mam16.html#Niven92}, volume = 16, year = 1992 }