%0 Journal Article %1 journals/tc/XiangCF16 %A Xiang, Dong %A Chakrabarty, Krishnendu %A Fujiwara, Hideo %D 2016 %J IEEE Trans. Computers %K dblp %N 9 %P 2767-2779 %T Multicast-Based Testing and Thermal-Aware Test Scheduling for 3D ICs with a Stacked Network-on-Chip. %U http://dblp.uni-trier.de/db/journals/tc/tc65.html#XiangCF16 %V 65

@article{journals/tc/XiangCF16, added-at = {2022-01-03T00:00:00.000+0100}, author = {Xiang, Dong and Chakrabarty, Krishnendu and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2588dd9bb6d03987a653e0bb7766d9e17/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.2015.2493548}, interhash = {ba4b5dd5788cb3d06a5a287f17473301}, intrahash = {588dd9bb6d03987a653e0bb7766d9e17}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 9, pages = {2767-2779}, timestamp = {2024-04-08T18:29:27.000+0200}, title = {Multicast-Based Testing and Thermal-Aware Test Scheduling for 3D ICs with a Stacked Network-on-Chip.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc65.html#XiangCF16}, volume = 65, year = 2016 }