%0 Conference Paper %1 conf/ats/ChenLSC95 %A Chen, Jwu E. %A Lee, Chung-Len %A Shen, Wen-Zen %A Chen, Beyin %B Asian Test Symposium %D 1995 %I IEEE Computer Society %K dblp %P 33-39 %T Fanout fault analysis for digital logic circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#ChenLSC95 %@ 0-8186-7129-7

@inproceedings{conf/ats/ChenLSC95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chen, Jwu E. and Lee, Chung-Len and Shen, Wen-Zen and Chen, Beyin}, biburl = {https://www.bibsonomy.org/bibtex/2820bd4f36973d8c843e3d501e0acfa97/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485313}, interhash = {bbcfff9197ddbec205d2a5ec4ba94c07}, intrahash = {820bd4f36973d8c843e3d501e0acfa97}, isbn = {0-8186-7129-7}, keywords = {dblp}, pages = {33-39}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:47.000+0200}, title = {Fanout fault analysis for digital logic circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#ChenLSC95}, year = 1995 }