%0 Conference Paper %1 conf/ats/YouHIKF10 %A You, Zhiqiang %A Huang, Jiedi %A Inoue, Michiko %A Kuang, Jishun %A Fujiwara, Hideo %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 371-374 %T Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#YouHIKF10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/YouHIKF10, added-at = {2023-03-24T00:00:00.000+0100}, author = {You, Zhiqiang and Huang, Jiedi and Inoue, Michiko and Kuang, Jishun and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/21ab26f44574e3dd259d46f43af690236/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2010.70}, interhash = {be984894c08637c1dce40d2ea6dd6aa4}, intrahash = {1ab26f44574e3dd259d46f43af690236}, isbn = {978-0-7695-4248-5}, keywords = {dblp}, pages = {371-374}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:56.000+0200}, title = {Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#YouHIKF10}, year = 2010 }