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%0 Journal Article
%1 journals/mr/LambertLCKTTBCMLM12
%A Lambert, Benoit
%A Labat, Nathalie
%A Carisetti, Dominique
%A Karboyan, Serge
%A Tartarin, Jean-Guy
%A Thorpe, Jim
%A Brunel, Laurent
%A Curutchet, Arnaud
%A Malbert, Nathalie
%A Latu-Romain, Eddy
%A Mermoux, Michel
%D 2012
%J Microelectron. Reliab.
%K dblp
%N 9-10
%P 2184-2187
%T Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test.
%U http://dblp.uni-trier.de/db/journals/mr/mr52.html#LambertLCKTTBCMLM12
%V 52
@article{journals/mr/LambertLCKTTBCMLM12,
added-at = {2022-02-04T00:00:00.000+0100},
author = {Lambert, Benoit and Labat, Nathalie and Carisetti, Dominique and Karboyan, Serge and Tartarin, Jean-Guy and Thorpe, Jim and Brunel, Laurent and Curutchet, Arnaud and Malbert, Nathalie and Latu-Romain, Eddy and Mermoux, Michel},
biburl = {https://www.bibsonomy.org/bibtex/245170c4dad762faf5d404e0c59e4b505/dblp},
ee = {https://doi.org/10.1016/j.microrel.2012.06.100},
interhash = {bfb8b60fbca5164bfe78531f90321f0f},
intrahash = {45170c4dad762faf5d404e0c59e4b505},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-10},
pages = {2184-2187},
timestamp = {2024-04-09T02:48:30.000+0200},
title = {Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#LambertLCKTTBCMLM12},
volume = 52,
year = 2012
}