%0 Conference Paper %1 conf/itc/RajkiTKMTTHTMEQ02 %A Rajski, Janusz %A Tyszer, Jerzy %A Kassab, Mark %A Mukherjee, Nilanjan %A Thompson, Rob %A Tsai, Kun-Han %A Hertwig, Andre %A Tamarapalli, Nagesh %A Mrugalski, Grzegorz %A Eide, Geir %A Qian, Jun %B ITC %D 2002 %I IEEE Computer Society %K dblp %P 301-310 %T Embedded Deterministic Test for Low-Cost Manufacturing Test. %U http://dblp.uni-trier.de/db/conf/itc/itc2002.html#RajkiTKMTTHTMEQ02 %@ 0-7803-7543-2

@inproceedings{conf/itc/RajkiTKMTTHTMEQ02, added-at = {2023-03-23T00:00:00.000+0100}, author = {Rajski, Janusz and Tyszer, Jerzy and Kassab, Mark and Mukherjee, Nilanjan and Thompson, Rob and Tsai, Kun-Han and Hertwig, Andre and Tamarapalli, Nagesh and Mrugalski, Grzegorz and Eide, Geir and Qian, Jun}, biburl = {https://www.bibsonomy.org/bibtex/26936246483ce3af1b730de98f5d27f93/dblp}, booktitle = {ITC}, crossref = {conf/itc/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041773}, interhash = {c05d86b8b6300db05240b1bbce59590f}, intrahash = {6936246483ce3af1b730de98f5d27f93}, isbn = {0-7803-7543-2}, keywords = {dblp}, pages = {301-310}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:16.000+0200}, title = {Embedded Deterministic Test for Low-Cost Manufacturing Test.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#RajkiTKMTTHTMEQ02}, year = 2002 }