%0 Journal Article %1 journals/dt/Maurer90 %A Maurer, Peter M. %D 1990 %J IEEE Des. Test Comput. %K dblp %N 6 %P 42-49 %T Dynamic Functional Testing for VLSI Circuits. %U http://dblp.uni-trier.de/db/journals/dt/dt7.html#Maurer90 %V 7

@article{journals/dt/Maurer90, added-at = {2020-05-17T00:00:00.000+0200}, author = {Maurer, Peter M.}, biburl = {https://www.bibsonomy.org/bibtex/278c468af6aafb8633a270e561b0c2c9a/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/54.64956}, interhash = {c1ad594bb4814306da5633ce52cdc2ae}, intrahash = {78c468af6aafb8633a270e561b0c2c9a}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 6, pages = {42-49}, timestamp = {2020-05-19T12:19:10.000+0200}, title = {Dynamic Functional Testing for VLSI Circuits.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt7.html#Maurer90}, volume = 7, year = 1990 }