Inproceedings,
Low-capture-power test generation for scan-based at-speed testing.
X. Wen, Y. Yamashita, S. Morishima, S. Kajihara, L. Wang, K. Saluja, and K. Kinoshita.ITC, page 10. IEEE Computer Society, (2005)
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- ITC
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- 2005
- pages
- 10
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- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584068
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- http://dblp.uni-trier.de/db/conf/itc/itc2005.html#WenYMKWSK05
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%1 conf/itc/WenYMKWSK05
%A Wen, Xiaoqing
%A Yamashita, Yoshiyuki
%A Morishima, Shohei
%A Kajihara, Seiji
%A Wang, Laung-Terng
%A Saluja, Kewal K.
%A Kinoshita, Kozo
%B ITC
%D 2005
%I IEEE Computer Society
%K dblp
%P 10
%T Low-capture-power test generation for scan-based at-speed testing.
%U http://dblp.uni-trier.de/db/conf/itc/itc2005.html#WenYMKWSK05
%@ 0-7803-9038-5
@inproceedings{conf/itc/WenYMKWSK05,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Wen, Xiaoqing and Yamashita, Yoshiyuki and Morishima, Shohei and Kajihara, Seiji and Wang, Laung-Terng and Saluja, Kewal K. and Kinoshita, Kozo},
biburl = {https://www.bibsonomy.org/bibtex/28b4f8485605e14ae4c01b7399a7a1561/dblp},
booktitle = {ITC},
crossref = {conf/itc/2005},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584068},
interhash = {c3850d72b62f6c836c5707829596340d},
intrahash = {8b4f8485605e14ae4c01b7399a7a1561},
isbn = {0-7803-9038-5},
keywords = {dblp},
pages = 10,
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:27:57.000+0200},
title = {Low-capture-power test generation for scan-based at-speed testing.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#WenYMKWSK05},
year = 2005
}