Inproceedings,
Behavioral modeling of drain current of an avalanche ISFET near breakdown.
M. Uzzal, P. Zarkesh-Ha, P. Szauter, and J. Edwards.SoCC, page 169-173. IEEE, (2016)
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- conf/socc/UzzalZSE16
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- inproceedings
- booktitle
- SoCC
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- 2016
- pages
- 169-173
- publisher
- IEEE
- crossref
- conf/socc/2016
- ee
- http://dx.doi.org/10.1109/SOCC.2016.7905459
- isbn
- 978-1-5090-1367-8
- url
- http://dblp.uni-trier.de/db/conf/socc/socc2016.html#UzzalZSE16
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%1 conf/socc/UzzalZSE16
%A Uzzal, Mohammad M.
%A Zarkesh-Ha, Payman
%A Szauter, Paul
%A Edwards, Jeremy S.
%B SoCC
%D 2016
%E Bhatia, Karan S.
%E Alioto, Massimo
%E Zhao, Danella
%E Marshall, Andrew
%E Sridhar, Ramalingam
%I IEEE
%K dblp
%P 169-173
%T Behavioral modeling of drain current of an avalanche ISFET near breakdown.
%U http://dblp.uni-trier.de/db/conf/socc/socc2016.html#UzzalZSE16
%@ 978-1-5090-1367-8
@inproceedings{conf/socc/UzzalZSE16,
added-at = {2017-04-26T00:00:00.000+0200},
author = {Uzzal, Mohammad M. and Zarkesh-Ha, Payman and Szauter, Paul and Edwards, Jeremy S.},
biburl = {https://www.bibsonomy.org/bibtex/21d2625bd96264674b3f93bda658c251d/dblp},
booktitle = {SoCC},
crossref = {conf/socc/2016},
editor = {Bhatia, Karan S. and Alioto, Massimo and Zhao, Danella and Marshall, Andrew and Sridhar, Ramalingam},
ee = {http://dx.doi.org/10.1109/SOCC.2016.7905459},
interhash = {c4aa476e2c420cd05a66ba2ac84d072e},
intrahash = {1d2625bd96264674b3f93bda658c251d},
isbn = {978-1-5090-1367-8},
keywords = {dblp},
pages = {169-173},
publisher = {IEEE},
timestamp = {2017-04-27T11:36:35.000+0200},
title = {Behavioral modeling of drain current of an avalanche ISFET near breakdown.},
url = {http://dblp.uni-trier.de/db/conf/socc/socc2016.html#UzzalZSE16},
year = 2016
}