%0 Journal Article %1 journals/mr/HidalgoFOM03 %A Hidalgo, Salvador %A Flores, David %A Obieta, Isabel %A Mazarredo, I. %D 2003 %J Microelectron. Reliab. %K dblp %N 3 %P 413-420 %T Passivation and packaging of positive bevelled edge termination and related electrical stability. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#HidalgoFOM03 %V 43

@article{journals/mr/HidalgoFOM03, added-at = {2021-10-14T00:00:00.000+0200}, author = {Hidalgo, Salvador and Flores, David and Obieta, Isabel and Mazarredo, I.}, biburl = {https://www.bibsonomy.org/bibtex/2b1e379f78859bd95fa8836f2562326a2/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00281-0}, interhash = {c4ba6deb3dc1213336de7c19527ce1ed}, intrahash = {b1e379f78859bd95fa8836f2562326a2}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 3, pages = {413-420}, timestamp = {2024-04-09T02:49:51.000+0200}, title = {Passivation and packaging of positive bevelled edge termination and related electrical stability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#HidalgoFOM03}, volume = 43, year = 2003 }