%0 Conference Paper %1 conf/nbis/WatanabeCKH10 %A Watanabe, Takanobu %A Cheng, Zixue %A Kansen, Mizuo %A Hisada, Masayuki %B NBiS %D 2010 %E Enokido, Tomoya %E Xhafa, Fatos %E Barolli, Leonard %E Takizawa, Makoto %E Uehara, Minoru %E Durresi, Arjan %I IEEE Computer Society %K dblp %P 469-474 %T A New Security Testing Method for Detecting Flash Vulnerabilities by Generating Test Patterns. %U http://dblp.uni-trier.de/db/conf/nbis/nbis2010.html#WatanabeCKH10 %@ 978-0-7695-4167-9

@inproceedings{conf/nbis/WatanabeCKH10, added-at = {2023-03-23T00:00:00.000+0100}, author = {Watanabe, Takanobu and Cheng, Zixue and Kansen, Mizuo and Hisada, Masayuki}, biburl = {https://www.bibsonomy.org/bibtex/2442226facaddcc2024c20686ce1ff6f5/dblp}, booktitle = {NBiS}, crossref = {conf/nbis/2010}, editor = {Enokido, Tomoya and Xhafa, Fatos and Barolli, Leonard and Takizawa, Makoto and Uehara, Minoru and Durresi, Arjan}, ee = {https://doi.ieeecomputersociety.org/10.1109/NBiS.2010.28}, interhash = {c52b6876bab503354fe5307d96ef8ca9}, intrahash = {442226facaddcc2024c20686ce1ff6f5}, isbn = {978-0-7695-4167-9}, keywords = {dblp}, pages = {469-474}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T14:37:26.000+0200}, title = {A New Security Testing Method for Detecting Flash Vulnerabilities by Generating Test Patterns.}, url = {http://dblp.uni-trier.de/db/conf/nbis/nbis2010.html#WatanabeCKH10}, year = 2010 }