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%0 Journal Article
%1 journals/tvlsi/SabryBAV97
%A Sabry, Mohammed Nabil
%A Bontemps, A.
%A Aubert, V.
%A Vahrmann, R.
%D 1997
%J IEEE Trans. Very Large Scale Integr. Syst.
%K dblp
%N 3
%P 283-289
%T Realistic and efficient simulation of electro-thermal effects in VLSI circuits.
%U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi5.html#SabryBAV97
%V 5
@article{journals/tvlsi/SabryBAV97,
added-at = {2024-06-10T00:00:00.000+0200},
author = {Sabry, Mohammed Nabil and Bontemps, A. and Aubert, V. and Vahrmann, R.},
biburl = {https://www.bibsonomy.org/bibtex/2beb3beca973b858e0ef68289c2fc6399/dblp},
ee = {https://www.wikidata.org/entity/Q56960022},
interhash = {c5e792dc4d2cc52406d6475c277684b9},
intrahash = {beb3beca973b858e0ef68289c2fc6399},
journal = {IEEE Trans. Very Large Scale Integr. Syst.},
keywords = {dblp},
number = 3,
pages = {283-289},
timestamp = {2024-06-17T07:06:10.000+0200},
title = {Realistic and efficient simulation of electro-thermal effects in VLSI circuits.},
url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi5.html#SabryBAV97},
volume = 5,
year = 1997
}