%0 Conference Paper %1 conf/cicc/KimCKPTA06 %A Kim, Daeik D. %A Cho, Choongyeun %A Kim, Jonghae %A Plouchart, Jean-Olivier %A Trzcinski, Robert %A Ahlgren, David %B CICC %D 2006 %I IEEE %K dblp %P 365-368 %T CMOS Mixed-Signal Circuit Process Variation Sensitivity Characterization for Yield Improvement. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#KimCKPTA06 %@ 1-4244-0075-9

@inproceedings{conf/cicc/KimCKPTA06, added-at = {2017-05-17T00:00:00.000+0200}, author = {Kim, Daeik D. and Cho, Choongyeun and Kim, Jonghae and Plouchart, Jean-Olivier and Trzcinski, Robert and Ahlgren, David}, biburl = {https://www.bibsonomy.org/bibtex/23da049973df39f151e87cd727c07fccc/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2006}, ee = {https://doi.org/10.1109/CICC.2006.320950}, interhash = {c5f910e49e466d0cabc355e8544a1218}, intrahash = {3da049973df39f151e87cd727c07fccc}, isbn = {1-4244-0075-9}, keywords = {dblp}, pages = {365-368}, publisher = {IEEE}, timestamp = {2019-10-17T23:09:18.000+0200}, title = {CMOS Mixed-Signal Circuit Process Variation Sensitivity Characterization for Yield Improvement.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#KimCKPTA06}, year = 2006 }