%0 Conference Paper %1 conf/itc/Johnson00 %A Johnson, Gerald H. %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 1013-1020 %T Challenges of high supply currents during VLSI test. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#Johnson00 %@ 0-7803-6546-1

@inproceedings{conf/itc/Johnson00, added-at = {2023-03-23T00:00:00.000+0100}, author = {Johnson, Gerald H.}, biburl = {https://www.bibsonomy.org/bibtex/2b944e66fddcd488b383ddc48dde84a41/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894314}, interhash = {c8d6e9a9fec5ddd82bfb690b475eb2ac}, intrahash = {b944e66fddcd488b383ddc48dde84a41}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {1013-1020}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Challenges of high supply currents during VLSI test.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#Johnson00}, year = 2000 }