%0 Journal Article %1 journals/mr/YuCLYF15 %A Yu, Xinhai %A Chai, Changchun %A Liu, Yang %A Yang, Yintang %A Fan, Qingyang %D 2015 %J Microelectron. Reliab. %K dblp %N 8 %P 1174-1179 %T Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#YuCLYF15 %V 55

@article{journals/mr/YuCLYF15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Yu, Xinhai and Chai, Changchun and Liu, Yang and Yang, Yintang and Fan, Qingyang}, biburl = {https://www.bibsonomy.org/bibtex/236d895c54a6c6a50c2d4da942c62660c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.002}, interhash = {cc3ffbdc56eb20b5312d824d255c1d70}, intrahash = {36d895c54a6c6a50c2d4da942c62660c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1174-1179}, timestamp = {2020-02-25T13:22:34.000+0100}, title = {Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#YuCLYF15}, volume = 55, year = 2015 }