%0 Journal Article %1 journals/mr/LimLENWG12 %A Lim, Meng Keong %A Lin, Jingyuan %A Ee, Yong Chiang %A Ng, Chee Mang %A Wei, Jun %A Gan, Chee Lip %D 2012 %J Microelectron. Reliab. %K dblp %N 8 %P 1553-1558 %T Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#LimLENWG12 %V 52

@article{journals/mr/LimLENWG12, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lim, Meng Keong and Lin, Jingyuan and Ee, Yong Chiang and Ng, Chee Mang and Wei, Jun and Gan, Chee Lip}, biburl = {https://www.bibsonomy.org/bibtex/21251bc4241e4a9705550c80eba1a1d96/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.12.026}, interhash = {ccd4674b334984b63a280584ad6cec91}, intrahash = {1251bc4241e4a9705550c80eba1a1d96}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1553-1558}, timestamp = {2020-02-25T13:24:23.000+0100}, title = {Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#LimLENWG12}, volume = 52, year = 2012 }