%0 Conference Paper %1 conf/cicc/NiiyamaITS08 %A Niiyama, Taro %A Ishida, Koichi %A Takamiya, Makoto %A Sakurai, Takayasu %B CICC %D 2008 %I IEEE %K dblp %P 137-140 %T Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2008.html#NiiyamaITS08 %@ 978-1-4244-2018-6

@inproceedings{conf/cicc/NiiyamaITS08, added-at = {2017-05-17T00:00:00.000+0200}, author = {Niiyama, Taro and Ishida, Koichi and Takamiya, Makoto and Sakurai, Takayasu}, biburl = {https://www.bibsonomy.org/bibtex/230c045268b162efd57afb62d8c1979b8/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2008}, ee = {https://doi.org/10.1109/CICC.2008.4672040}, interhash = {cec453288276874f6d5502da95d6ac66}, intrahash = {30c045268b162efd57afb62d8c1979b8}, isbn = {978-1-4244-2018-6}, keywords = {dblp}, pages = {137-140}, publisher = {IEEE}, timestamp = {2019-10-17T23:07:57.000+0200}, title = {Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2008.html#NiiyamaITS08}, year = 2008 }