%0 Journal Article %1 journals/ieiceee/LiCLLWZLY19 %A Li, Yang %A Chai, Changchun %A Liu, Yuqian %A Li, Yun %A Wu, Han %A Zhang, Wei %A Li, Fuxing %A Yang, Yintang %D 2019 %J IEICE Electron. Express %K dblp %N 19 %P 20190498 %T Upset and damage mechanisms of the three-dimensional silicon device induced by high power microwave interference. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee16.html#LiCLLWZLY19 %V 16

@article{journals/ieiceee/LiCLLWZLY19, added-at = {2021-02-12T00:00:00.000+0100}, author = {Li, Yang and Chai, Changchun and Liu, Yuqian and Li, Yun and Wu, Han and Zhang, Wei and Li, Fuxing and Yang, Yintang}, biburl = {https://www.bibsonomy.org/bibtex/2808ab3febb1762d900f490d42aa64704/dblp}, ee = {https://doi.org/10.1587/elex.16.20190498}, interhash = {cf0b159f9edae73e88861515cee75638}, intrahash = {808ab3febb1762d900f490d42aa64704}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 19, pages = 20190498, timestamp = {2024-04-09T06:47:25.000+0200}, title = {Upset and damage mechanisms of the three-dimensional silicon device induced by high power microwave interference.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee16.html#LiCLLWZLY19}, volume = 16, year = 2019 }