%0 Journal Article %1 journals/mr/RottRRGG14 %A Rott, Gunnar Andreas %A Rott, Karina %A Reisinger, Hans %A Gustin, Wolfgang %A Grasser, Tibor %D 2014 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2310-2314 %T Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#RottRRGG14 %V 54

@article{journals/mr/RottRRGG14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Rott, Gunnar Andreas and Rott, Karina and Reisinger, Hans and Gustin, Wolfgang and Grasser, Tibor}, biburl = {https://www.bibsonomy.org/bibtex/2428f8579de63d70dedaafe1ae9dce1a3/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.07.040}, interhash = {cf29cedda939a2f3f87c526678cfdcb8}, intrahash = {428f8579de63d70dedaafe1ae9dce1a3}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2310-2314}, timestamp = {2020-02-25T13:29:47.000+0100}, title = {Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#RottRRGG14}, volume = 54, year = 2014 }