%0 Conference Paper %1 conf/itc/GoorS99 %A van de Goor, Ad J. %A Schanstra, Ivo %B ITC %D 1999 %I IEEE Computer Society %K dblp %P 983-992 %T Industrial evaluation of stress combinations for march tests applied to SRAMs. %U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#GoorS99 %@ 0-7803-5753-1

@inproceedings{conf/itc/GoorS99, added-at = {2023-03-23T00:00:00.000+0100}, author = {van de Goor, Ad J. and Schanstra, Ivo}, biburl = {https://www.bibsonomy.org/bibtex/26aecd11eb85a8413e06f62f37f83a332/dblp}, booktitle = {ITC}, crossref = {conf/itc/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805831}, interhash = {d028bd32e809cb95edc8a160121afe35}, intrahash = {6aecd11eb85a8413e06f62f37f83a332}, isbn = {0-7803-5753-1}, keywords = {dblp}, pages = {983-992}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:23.000+0200}, title = {Industrial evaluation of stress combinations for march tests applied to SRAMs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#GoorS99}, year = 1999 }