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%0 Conference Paper
%1 conf/itc/SunterMD01
%A Sunter, Stephen K.
%A McDonald, Charles
%A Danialy, Givargis
%B ITC
%D 2001
%I IEEE Computer Society
%K dblp
%P 204-210
%T Contactless digital testing of IC pin leakage currents.
%U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#SunterMD01
%@ 0-7803-7169-0
@inproceedings{conf/itc/SunterMD01,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Sunter, Stephen K. and McDonald, Charles and Danialy, Givargis},
biburl = {https://www.bibsonomy.org/bibtex/2c933dcd6918fe3bf8b076db9c12215aa/dblp},
booktitle = {ITC},
crossref = {conf/itc/2001},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966635},
interhash = {d0b5162d1b9ad7fd033a1c04124237d2},
intrahash = {c933dcd6918fe3bf8b076db9c12215aa},
isbn = {0-7803-7169-0},
keywords = {dblp},
pages = {204-210},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:28:56.000+0200},
title = {Contactless digital testing of IC pin leakage currents.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#SunterMD01},
year = 2001
}