%0 Conference Paper %1 conf/itc/Al-ArsGBR01 %A Al-Ars, Zaid %A van de Goor, Ad J. %A Braun, Jens %A Richter, Detlev %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 783-792 %T Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#Al-ArsGBR01 %@ 0-7803-7169-0

@inproceedings{conf/itc/Al-ArsGBR01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Al-Ars, Zaid and van de Goor, Ad J. and Braun, Jens and Richter, Detlev}, biburl = {https://www.bibsonomy.org/bibtex/24b0b2c7a3eaff23934c126a210ea3f94/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966700}, interhash = {d2d8f7a2113d0d7f63893ceb8cc399d3}, intrahash = {4b0b2c7a3eaff23934c126a210ea3f94}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {783-792}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#Al-ArsGBR01}, year = 2001 }