%0 Journal Article %1 journals/mr/BrunelLMBFGBCGMCL13 %A Brunel, Laurent %A Lambert, Benoit %A Mezenge, P. %A Bataille, J. %A Floriot, D. %A Grünenpütt, Jan %A Blanck, Hervé %A Carisetti, D. %A Gourdel, Y. %A Malbert, Nathalie %A Curutchet, Arnaud %A Labat, Nathalie %D 2013 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1450-1455 %T Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#BrunelLMBFGBCGMCL13 %V 53

@article{journals/mr/BrunelLMBFGBCGMCL13, added-at = {2020-02-22T00:00:00.000+0100}, author = {Brunel, Laurent and Lambert, Benoit and Mezenge, P. and Bataille, J. and Floriot, D. and Grünenpütt, Jan and Blanck, Hervé and Carisetti, D. and Gourdel, Y. and Malbert, Nathalie and Curutchet, Arnaud and Labat, Nathalie}, biburl = {https://www.bibsonomy.org/bibtex/282e781d4143990e3e5c75e1cbfbad7a5/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.07.095}, interhash = {d36d75f63159d9eab0606edc1cd45928}, intrahash = {82e781d4143990e3e5c75e1cbfbad7a5}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1450-1455}, timestamp = {2020-02-25T13:25:37.000+0100}, title = {Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#BrunelLMBFGBCGMCL13}, volume = 53, year = 2013 }