%0 Conference Paper %1 conf/ats/BagweP00 %A Bagwe, Ameet %A Parekhji, Rubin A. %B Asian Test Symposium %D 2000 %I IEEE Computer Society %K dblp %P 260- %T Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. %U http://dblp.uni-trier.de/db/conf/ats/ats2000.html#BagweP00 %@ 0-7695-0887-1

@inproceedings{conf/ats/BagweP00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Bagwe, Ameet and Parekhji, Rubin A.}, biburl = {https://www.bibsonomy.org/bibtex/27bb185edb243a5ca74adeb802c3008c5/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893635}, interhash = {d52ad4a9e9258c176ffd956beda735d0}, intrahash = {7bb185edb243a5ca74adeb802c3008c5}, isbn = {0-7695-0887-1}, keywords = {dblp}, pages = {260-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:42.000+0200}, title = {Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2000.html#BagweP00}, year = 2000 }