A RTN variation tolerant guard band design for a deeper nanometer scaled SRAM screening test: Based on EM Gaussians mixtures approximations model of long-tail distributions.
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%0 Conference Paper
%1 conf/latw/SomhaY13
%A Somha, Worawit
%A Yamauchi, Hiroyuki
%B LATW
%D 2013
%I IEEE Computer Society
%K dblp
%P 1-6
%T A RTN variation tolerant guard band design for a deeper nanometer scaled SRAM screening test: Based on EM Gaussians mixtures approximations model of long-tail distributions.
%U http://dblp.uni-trier.de/db/conf/latw/latw2013.html#SomhaY13
%@ 978-1-4799-0597-3
@inproceedings{conf/latw/SomhaY13,
added-at = {2024-02-05T00:00:00.000+0100},
author = {Somha, Worawit and Yamauchi, Hiroyuki},
biburl = {https://www.bibsonomy.org/bibtex/28b268bfc87e8e225f772b3196a89b28a/dblp},
booktitle = {LATW},
crossref = {conf/latw/2013},
ee = {https://doi.ieeecomputersociety.org/10.1109/LATW.2013.6562687},
interhash = {d6434b83f3eabc48df1054129c43ee98},
intrahash = {8b268bfc87e8e225f772b3196a89b28a},
isbn = {978-1-4799-0597-3},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T03:52:10.000+0200},
title = {A RTN variation tolerant guard band design for a deeper nanometer scaled SRAM screening test: Based on EM Gaussians mixtures approximations model of long-tail distributions.},
url = {http://dblp.uni-trier.de/db/conf/latw/latw2013.html#SomhaY13},
year = 2013
}
