%0 Journal Article %1 journals/mr/HanKVGDRS05 %A Han, Jin-Ping %A Koo, Sang-Mo %A Vogel, Eric M. %A Gusev, Evgeni P. %A D'Emic, C. %A Richter, Curt A. %A Suehle, John S. %D 2005 %J Microelectron. Reliab. %K dblp %N 5-6 %P 783-785 %T Reverse short channel effects in high-k gated nMOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#HanKVGDRS05 %V 45

@article{journals/mr/HanKVGDRS05, added-at = {2022-11-15T00:00:00.000+0100}, author = {Han, Jin-Ping and Koo, Sang-Mo and Vogel, Eric M. and Gusev, Evgeni P. and D'Emic, C. and Richter, Curt A. and Suehle, John S.}, biburl = {https://www.bibsonomy.org/bibtex/2bbad2f38571831821d27163ecbe1035b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.11.049}, interhash = {d6571581a2729a257855c24d5fa4a67d}, intrahash = {bbad2f38571831821d27163ecbe1035b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {5-6}, pages = {783-785}, timestamp = {2024-04-09T02:48:30.000+0200}, title = {Reverse short channel effects in high-k gated nMOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#HanKVGDRS05}, volume = 45, year = 2005 }