%0 Journal Article %1 journals/mr/LiaoCDSLTS15 %A Liao, Guanglan %A Chen, Pengfei %A Du, Li %A Su, Lei %A Liu, Zhiping %A Tang, Zirong %A Shi, Tielin %D 2015 %J Microelectron. Reliab. %K dblp %N 12 %P 2826-2832 %T Using SOM neural network for X-ray inspection of missing-bump defects in three-dimensional integration. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#LiaoCDSLTS15 %V 55

@article{journals/mr/LiaoCDSLTS15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Liao, Guanglan and Chen, Pengfei and Du, Li and Su, Lei and Liu, Zhiping and Tang, Zirong and Shi, Tielin}, biburl = {https://www.bibsonomy.org/bibtex/2e0180e159d26b16c8dab5204b932bc71/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.09.009}, interhash = {d7c4b4cb32f853d1d0b91e9ee90a5826}, intrahash = {e0180e159d26b16c8dab5204b932bc71}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {2826-2832}, timestamp = {2020-02-25T13:26:32.000+0100}, title = {Using SOM neural network for X-ray inspection of missing-bump defects in three-dimensional integration.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#LiaoCDSLTS15}, volume = 55, year = 2015 }