%0 Conference Paper %1 conf/ats/MoriMBM97 %A Mori, Junji %A Mathew, Ben %A Burns, Dave %A Mok, Yeuk-Hai %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 108-111 %T Testability Features of R10000 Microprocessor. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#MoriMBM97 %@ 0-8186-8209-4

@inproceedings{conf/ats/MoriMBM97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Mori, Junji and Mathew, Ben and Burns, Dave and Mok, Yeuk-Hai}, biburl = {https://www.bibsonomy.org/bibtex/26625719b56cfc9dadb7adeea4d7de017/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643930}, interhash = {da5156e245ed37dedb72b30013265dc0}, intrahash = {6625719b56cfc9dadb7adeea4d7de017}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {108-111}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {Testability Features of R10000 Microprocessor.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#MoriMBM97}, year = 1997 }