%0 Conference Paper %1 conf/irps/WangLYSC15 %A Wang, Miaomiao %A Liu, Zuoguang %A Yamashita, Tenko %A Stathis, James H. %A Chen, Chia-Yu %B IRPS %D 2015 %I IEEE %K dblp %P 4 %T Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#WangLYSC15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/WangLYSC15, added-at = {2023-06-28T00:00:00.000+0200}, author = {Wang, Miaomiao and Liu, Zuoguang and Yamashita, Tenko and Stathis, James H. and Chen, Chia-Yu}, biburl = {https://www.bibsonomy.org/bibtex/20b2dde6c9f08a20968f312ed38054415/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112727}, interhash = {da9036a607aa6d6f055704ad04e461d3}, intrahash = {0b2dde6c9f08a20968f312ed38054415}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 4, publisher = {IEEE}, timestamp = {2024-04-10T16:54:51.000+0200}, title = {Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#WangLYSC15}, year = 2015 }