%0 Conference Paper %1 conf/ats/HalderC01 %A Halder, Achintya %A Chatterjee, Abhijit %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 344- %T Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#HalderC01 %@ 0-7695-1378-6

@inproceedings{conf/ats/HalderC01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Halder, Achintya and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/213478cfddefcac4591f168dffd0b7371/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990307}, interhash = {db648d4d3e76a1abc47122fad1e102aa}, intrahash = {13478cfddefcac4591f168dffd0b7371}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {344-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#HalderC01}, year = 2001 }