%0 Conference Paper %1 conf/vlsid/RaoBA03 %A Rao, Lan %A Bushnell, Michael L. %A Agrawal, Vishwani D. %B VLSI Design %D 2003 %I IEEE Computer Society %K dblp %P 353-360 %T New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#RaoBA03 %@ 0-7695-1868-0

@inproceedings{conf/vlsid/RaoBA03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Rao, Lan and Bushnell, Michael L. and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/272ec468c45b0144bb7a6f8eb9ecb58c9/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183162}, interhash = {dcde11b52c0f1968100c0d5a39a941e6}, intrahash = {72ec468c45b0144bb7a6f8eb9ecb58c9}, isbn = {0-7695-1868-0}, keywords = {dblp}, pages = {353-360}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:18:49.000+0200}, title = {New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#RaoBA03}, year = 2003 }