%0 Conference Paper %1 conf/iccad/YuB11 %A Yu, Xiaochun %A Blanton, R. D. (Shawn) %B ICCAD %D 2011 %E Phillips, Joel R. %E Hu, Alan J. %E Graeb, Helmut %I IEEE Computer Society %K dblp %P 768-773 %T Statistical defect-detection analysis of test sets using readily-available tester data. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2011.html#YuB11 %@ 978-1-4577-1399-6

@inproceedings{conf/iccad/YuB11, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yu, Xiaochun and Blanton, R. D. (Shawn)}, biburl = {https://www.bibsonomy.org/bibtex/247ec1af691901b18b20036741878114c/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2011}, editor = {Phillips, Joel R. and Hu, Alan J. and Graeb, Helmut}, ee = {http://dl.acm.org/citation.cfm?id=2132492}, interhash = {dd273baf1bd638c8849519081b465639}, intrahash = {47ec1af691901b18b20036741878114c}, isbn = {978-1-4577-1399-6}, keywords = {dblp}, pages = {768-773}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T17:55:34.000+0200}, title = {Statistical defect-detection analysis of test sets using readily-available tester data.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2011.html#YuB11}, year = 2011 }