%0 Report %1 BLIS2003 %A Blish, Richard %A Dellin, Ted %A Huber, Steve %A Johnson, Martin %A Maiz, Jose %A Likins, Bob %A Lycoudes, Nick %A McPherson, Joe %A Peng, Yeng %A Peridier, Carl %A Preussger, Andreas %A Prokop, George %A Tullos, Larry %D 2003 %K imported %T Critical Reliability Challenges for The International Technology Roadmap for Semiconductors (ITRS)

@techreport{BLIS2003, added-at = {2013-01-07T16:10:56.000+0100}, author = {Blish, Richard and Dellin, Ted and Huber, Steve and Johnson, Martin and Maiz, Jose and Likins, Bob and Lycoudes, Nick and McPherson, Joe and Peng, Yeng and Peridier, Carl and Preussger, Andreas and Prokop, George and Tullos, Larry}, biburl = {https://www.bibsonomy.org/bibtex/27cc57bc93bfd24e1db7c3316714ff79a/olivia.bluder}, file = {:P\:\\KAI_AP2\\People\\Bluder\\Literatur\\Reliability_common\\BLISH_et_al_Critical_Reliability_Challenges.pdf:PDF}, institution = {International SEMATECH}, interhash = {de00f1ecaee92420428ebe74f8705bb2}, intrahash = {7cc57bc93bfd24e1db7c3316714ff79a}, keywords = {imported}, owner = {bluder}, timestamp = {2013-01-07T16:11:17.000+0100}, title = {Critical Reliability Challenges for The International Technology Roadmap for Semiconductors ({ITRS})}, year = 2003 }