%0 Journal Article %1 journals/jetc/ChaudhuriMJ14 %A Chaudhuri, Sourindra M. %A Mishra, Prateek %A Jha, Niraj K. %D 2014 %J JETC %K dblp %N 2 %P 19:1-19:20 %T Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology. %U http://dblp.uni-trier.de/db/journals/jetc/jetc11.html#ChaudhuriMJ14 %V 11

@article{journals/jetc/ChaudhuriMJ14, added-at = {2018-11-06T00:00:00.000+0100}, author = {Chaudhuri, Sourindra M. and Mishra, Prateek and Jha, Niraj K.}, biburl = {https://www.bibsonomy.org/bibtex/2c31b82f9aa3809ea2bfe919b5b824cb7/dblp}, ee = {https://doi.org/10.1145/2665066}, interhash = {df387f2ba4a30d383aa729f317af606e}, intrahash = {c31b82f9aa3809ea2bfe919b5b824cb7}, journal = {JETC}, keywords = {dblp}, number = 2, pages = {19:1-19:20}, timestamp = {2018-11-07T12:20:12.000+0100}, title = {Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology.}, url = {http://dblp.uni-trier.de/db/journals/jetc/jetc11.html#ChaudhuriMJ14}, volume = 11, year = 2014 }