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%0 Journal Article
%1 journals/vlsi/RochaMCWS08
%A Rocha, Luís Alexandre
%A Mol, Lukas
%A Cretu, Edmond
%A Wolffenbuttel, Reinoud F.
%A da Silva, José Machado
%D 2008
%J VLSI Design
%K dblp
%P 283451:1-283451:7
%T A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization.
%U http://dblp.uni-trier.de/db/journals/vlsi/vlsi2008.html#RochaMCWS08
%V 2008
@article{journals/vlsi/RochaMCWS08,
added-at = {2020-10-26T00:00:00.000+0100},
author = {Rocha, Luís Alexandre and Mol, Lukas and Cretu, Edmond and Wolffenbuttel, Reinoud F. and da Silva, José Machado},
biburl = {https://www.bibsonomy.org/bibtex/225827b7f862138021681e07b39d5fd5e/dblp},
ee = {https://www.wikidata.org/entity/Q58646440},
interhash = {dfd37810185836c0b7c063f5a315d431},
intrahash = {25827b7f862138021681e07b39d5fd5e},
journal = {VLSI Design},
keywords = {dblp},
pages = {283451:1-283451:7},
timestamp = {2020-10-27T11:45:39.000+0100},
title = {A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization.},
url = {http://dblp.uni-trier.de/db/journals/vlsi/vlsi2008.html#RochaMCWS08},
volume = 2008,
year = 2008
}